Study of the Structure and Chemical Nature of Porous Si and Siloxene by STM, AFM, XPS, and LIMA-Reference-Cited by-同舟云学术

Study of the Structure and Chemical Nature of Porous Si and Siloxene by STM, AFM, XPS, and LIMA

Published:1994-02-01 Issue:2 Volume:141 Page:402-409
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:
Short-container-title:J. Electrochem. Soc.

Author:

Yau Shueh‐Lin¹²³,Arendt Mark¹²³,Bard Allen J.¹²³,Evans Brian¹²³,Tsai C.¹²³,Sarathy J.¹²³,Campbell J. C.¹²³

Affiliation:

1. Department of Chemistry and Biochemistry, The University of Texas at Austin, Austin, Texas 78712

2. Microchemical Analysis and Surface Properties, Pilkington Technology Center, Lancashire, England

3. Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://iopscience.iop.org/article/10.1149/1.2054740/pdf

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