XPS and ToF-SIMS Investigation of Native Oxides and Passive Films Formed on Nickel Alloys Containing Chromium and Molybdenum

Author:

Wang Zuocheng,Carrière Charly,Seyeux Antoine,Zanna Sandrine,Mercier DimitriORCID,Marcus PhilippeORCID

Abstract

X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectrometry were combined to characterize the surface oxides (native oxides and passive films) formed on Ni-based alloys containing chromium and molybdenum. Two alloys were studied, Ni-20Cr and Ni-20Cr-10Mo (in wt.%). For Ni-20Cr, both native oxide and passive films formed in acidic medium present a duplex structure comprising a Ni and Cr outer hydroxide layer and a Cr inner oxide layer. The Ni-20Cr-10Mo alloy presents a similar bilayer structure, but with Mo oxide located at the outer layer/inner layer interface. Cr enrichment is observed after passivation for both alloys. The corrosion resistance in acidic solution containing chlorides is enhanced by Mo, and by electrochemical pre-passivation in Cl free solution.

Funder

Office of Naval Research Global

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

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