Abstract
The polygonal finite element method (PFEM) is proposed as a fast and accurate technique to simulate the impedance spectroscopy (IS) of polycrystalline materials. While conventional finite element method (FEM) requires explicit meshing of the grains and grain boundaries, in PFEM each region can be treated as an element. We demonstrate that the number of degrees of freedom in PFEM can be lower by a factor of 30 when compared to FEM, thus speeding up simulations by a factor of 3.5. A simple example demonstrates the use of PFEM to generate IS on samples with various grain boundary widths.
Publisher
The Electrochemical Society
Subject
Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials