Numerical Calculations of the Electrical Effects Induced by Structural Imperfections on MOS Capacitors-Reference-Cited by-同舟云学术

Numerical Calculations of the Electrical Effects Induced by Structural Imperfections on MOS Capacitors

Published:1994-06-01 Issue:6 Volume:141 Page:1621-1628
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:
Short-container-title:J. Electrochem. Soc.

Author:

Lopes M. C. Valente¹²,Hasenack C. M.¹²,Baranauskas V.¹²

Affiliation:

1. LSI/PEE/EPUSP, CEP 05508‐900, São Paulo, SP, Brazil

2. DSIF/FEE/UNICAMP, c.p. 6101, CEP 13081, Campinas, SP, Brazil

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://iopscience.iop.org/article/10.1149/1.2054972/pdf

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