Structural and Charging Stability of Metal Nanodot Memory in SiO2; First-Principles Study
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Published:2018-07-20
Issue:2
Volume:86
Page:69-75
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ISSN:1938-6737
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Container-title:ECS Transactions
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language:en
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Short-container-title:ECS Trans.
Author:
Nakayama Takashi,Yamazaki Shota,Shiraishi Yuto
Publisher
The Electrochemical Society