Effect of Combined Oxygenation and Gettering on Minority Carrier Lifetime in High-Resistivity FZ Silicon-Reference-Cited by-同舟云学术

Effect of Combined Oxygenation and Gettering on Minority Carrier Lifetime in High-Resistivity FZ Silicon

Published:2004 Issue:10 Volume:151 Page:G652
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:en
Short-container-title:J. Electrochem. Soc.

Author:

Lozano M.,Ullán M.,Martı́nez C.,Fonseca L.,Rafı́ J. M.,Campabadal F.,Cabruja E.,Fleta C.,Key M.,Bermejo S.

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

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