Author:
Haga Kengo,Shiratori Yusuke,Ito Kohei,Sasaki Kazunari
Abstract
This paper reports the chemical degradation of Ni-based SOFC anodes caused by small amounts of impurities supplied with fuels. In particular, the impurity dependence of degradation behaviors as well as poisoning mechanisms are highlighted and investigated. Poisoning effects by chlorine and siloxanes are found to be critical to achieve satisfactory SOFC durability. In addition, it has also been demonstrated that phosphorus and boron compounds led to gradual decrease in cell voltage, Ni grain growth, and even formation of nickel phosphates. The measured trends are discussed in relation to the thermochemical calculations and FESEM/STEM-EDX analysis.
Publisher
The Electrochemical Society
Cited by
13 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献