Characteristics of a Capacitive Probe Array for Direct Surface Charge Detection-Reference-Cited by-同舟云学术

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Characteristics of a Capacitive Probe Array for Direct Surface Charge Detection

Published:2007 Issue:1 Volume:10 Page:H34
ISSN:1099-0062
Container-title:Electrochemical and Solid-State Letters
language:en
Short-container-title:Electrochem. Solid-State Lett.

Author:

Kim Kyung-Min,Seo Minha,Choi Byung Joon,Kim Seong Keun,Hwang Cheol Seong

Publisher

The Electrochemical Society

Subject

Electrical and Electronic Engineering,Electrochemistry,Physical and Theoretical Chemistry,General Materials Science,General Chemical Engineering

Reference11 articles.

1. SPM-based data storage for ultrahigh density recording

2. Fabrication of a metal-oxide-semiconductor-type capacitive microtip array using SiO2 or HfO2 gate insulators

3. Atomic force microscope cantilevers for combined thermomechanical data writing and reading

4. Fabrication and Characteristics of a Field Effect Transistor-Type Charge Sensor for Detecting Deoxyribonucleic Acid Sequence

5. Scanning resistive probe microscopy: Imaging ferroelectric domains

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