(Invited) Single Defect Characterization at Si/SiO
2
Interface
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Published:2017-05-01
Issue:1
Volume:79
Page:79-89
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ISSN:1938-6737
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Container-title:ECS Transactions
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language:en
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Short-container-title:ECS Trans.
Author:
Tsuchiya Toshiaki
Publisher
The Electrochemical Society