Characterization of Spinel‐Type Cobalt and Nickel Oxide Thin Films by X‐Ray Near Grazing Diffraction, Transmission and Reflectance Spectroscopies, and Cyclic Voltammetry-Reference-Cited by-同舟云学术

Characterization of Spinel‐Type Cobalt and Nickel Oxide Thin Films by X‐Ray Near Grazing Diffraction, Transmission and Reflectance Spectroscopies, and Cyclic Voltammetry

Published:1995-06-01 Issue:6 Volume:142 Page:1777-1783
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:
Short-container-title:J. Electrochem. Soc.

Author:

Nkeng P.¹²,Poillerat G.¹²,Koenig J. F.¹²,Chartier P.¹²,Lefez B.¹²,Lopitaux J.¹²,Lenglet M.¹²

Affiliation:

1. Laboratoire d'Electrochimie et de Chimie Physique du Corps Solide, URA CNRS No. 405, Université Louis Pasteur, 67000 Strasbourg, France

2. Laboratoire de Physiocochimie et de Chimie des Matériaux, Université de Rouen, 76131 Mont Saint Aignan Cedex, France

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://iopscience.iop.org/article/10.1149/1.2044193/pdf

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