On the Correlation of Aqueous and Nonaqueous In Situ and Ex Situ Photoluminescent Emissions from Porous Silicon: Evidence for Surface‐Bound Emitters-Reference-Cited by-同舟云学术

On the Correlation of Aqueous and Nonaqueous In Situ and Ex Situ Photoluminescent Emissions from Porous Silicon: Evidence for Surface‐Bound Emitters

Published:1998-09-01 Issue:9 Volume:145 Page:3284-3300
ISSN:0013-4651
Container-title:Journal of The Electrochemical Society
language:
Short-container-title:J. Electrochem. Soc.

Author:

Gole James L.¹²³⁴,Dudel Frank P.¹²³⁴,Seals Lenward¹²³⁴,Reiger Melissa¹²³⁴,Kohl Paul¹²³⁴,Bottomley Lawrence A.¹²³⁴

Affiliation:

1. School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332‐0430

2. School of Chemical Engineering and Materials Science, Sarkeys Energy Center, University of Oklahoma, Norman, Oklahoma 73019‐0628

3. School of Chemical Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332‐0100

4. School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, Georgia 30332‐0400

Publisher

The Electrochemical Society

Subject

Materials Chemistry,Electrochemistry,Surfaces, Coatings and Films,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

https://iopscience.iop.org/article/10.1149/1.1838799/pdf

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Electroless etching of Si with IO3– and related species;Nanoscale Research Letters;2012-06-20

2. Acceleration of groove formation in silicon using catalytic wire electrodes for development of a slicing technique;Journal of Materials Processing Technology;2010-01

3. Morphological and optical characteristics of porous silicon produced by anodization process in HF-acetonitrile and HF-ethanol solutions;Journal of the Brazilian Chemical Society;2008

4. POROUS SILICON – SENSORS AND FUTURE APPLICATIONS;Nanosilicon;2008

5. Room temperature air oxidation of nanostructured Si thin films with varying porosities as studied by x-ray photoelectron spectroscopy;Journal of Applied Physics;2006-04-15