Simultaneous Topography and Recognition Imaging Using Force Microscopy-Reference-Cited by-同舟云学术

Simultaneous Topography and Recognition Imaging Using Force Microscopy

Published:2004-09 Issue:3 Volume:87 Page:1981-1990
ISSN:0006-3495
Container-title:Biophysical Journal
language:en
Short-container-title:Biophysical Journal

Author:

Stroh Cordula M.,Ebner Andreas,Geretschläger Manfred,Freudenthaler Günter,Kienberger Ferry,Kamruzzahan A.S.M.,Smith-Gill Sandra J.,Gruber Hermann J.,Hinterdorfer Peter

Publisher

Elsevier BV

Subject

Biophysics

Reference44 articles.

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3. Data analysis of interaction forces measured with the atomic force microscope;Baumgartner;Ultramicroscopy,2000

4. Atomic force microscope;Binnig;Phys. Rev. Lett.,1986

5. Calculation of thermal noise in atomic force microscopy;Butt;Nanotechnology,1995

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