A Feasibility Study on X-Ray Stress Measurement with CdTe Pixel Detector

Author:

SUZUKI Kenji1,SHIRO Ayumi2,TOYOKAWA Hidenori3,SAJI Choji3,SHOBU Takahisa4

Affiliation:

1. Faculty of Education, Niigata University

2. Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology

3. Japan Synchrotron Radiation Research Institute

4. Material Sciences Research Center, Japan Atomic Energy Agency

Publisher

Society of Materials Science, Japan

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference12 articles.

1. 1) P.J. Withers, “ Use of synchrotron X-ray radiation for stress measurement”, Analysis of Residual stress by Diffraction using Neutron and Synchrotron Radiation, Ed. by M.E. Fitzpatrick and A. Lodini, Taylor & Francis, pp.170-218 (2003).

2. 2) K. Suzuki, T. Shobu, A. Shiro and S. Zhang,“ Stress evaluation in material with coarse grains using area detector”, Journal of the Society of Materials Science, Japan, Vol. 63, No. 7, pp. 527-532 (2014).

3. 3) K. Suzuki, T. Shobu and A. Shiro,“ Stress measurement of coarse grains using double exposure method”, Journal of the Society of Materials Science, Japan, Vol. 68, No. 4, pp. 312-317 (2019).

4. 4) K. Suzuki, T. Shobu, A. Shiro and S. Zhang, “ Evaluation of welding residual stresses using diffraction spot trace method ”, Advanced Materials Research, Vol. 996, pp. 76-81 (2014).

5. 5) J. Shibano, K. Kajiwara, T. Tsukamoto, H. Kawai, S. Miura, S. Zhang, T. Shobu and M. Kobayashi,“Evaluation of ductile damage progress of aluminum single crystal with prior activity of single slip system under tensile loading by using synchrotron white X-ray”, Material Science Forum, Vol. 777, pp. 176-181(2014).

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. 白色X線応力測定法の基礎と応用;Journal of the Society of Materials Science, Japan;2023-04-15

2. A Study on Stress Measurement of Weld Part using Double Exposure Mehtod;Journal of the Society of Materials Science, Japan;2022-12-15

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