Finding Fault Injection Location via Evaluation of Electromagnetic Emission from Cryptographic ICs
Author:
Funder
Defense Acquisition Program Administration
Publisher
Korean Institute of Electromagnetic Engineering and Science
Link
http://jkiees.org/download/download_pdf?doi=10.5515/KJKIEES.2024.35.7.585
Reference11 articles.
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2. E. Brier, C. Clavier, and F. Olivier "Correlation power analysis with a leakage model," in Proceedings of Cryptographic Hardware and Embedded Systems - CHES 2004. Lecture Notes in Computer Science, Berlin, 2004, vol. 3156, pp. 16-29. 10.1007/978-3-540-28632-5_2
3. G. Piret, J. J. Quisquater, "A differential fault attack technique against SPN structures, with application to the A ES and KHAZAD," in Cryptographic Hardware and Embedded Systems, CHES 2003, LNCS, Berlin, 2003, vol. 2779, pp. 77-88. 10.1007/978-3-540-45238-6_7
4. M. Madau, "A methodology to localise EMFI areas on microcontrollers," Ph.D. dissertation, Université Montpellier University, Montpellier, 2019.
5. S. Lim, J. Han, and D. G. Han, "Single-byte error-based practical differential fault attack on bit-sliced lightweight block cipher PIPO," IEEE Access, vol. 10, pp. 67802-67813, Jun. 2022. 10.1109/ACCESS.2022.3185209
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