A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope
Author:
Affiliation:
1. National Institute of Advanced Industrial Science and Technology (AIST), Advanced Manufacturing Research Institute (AM-RI)
Publisher
Japanese Society of Tribologists
Subject
Surfaces, Coatings and Films
Link
https://www.jstage.jst.go.jp/article/trol/11/6/11_646/_pdf
Reference26 articles.
1. [1] Binnig, G., Rohrer, H., Gerber, Ch. and Weibel, E., “Surface Studies by Scanning Tunneling Microscopy,” Physical Review Letters, 49, 1, 1982, 57-61.
2. [2] Binnig, G., Quate, C. F. and Gerber, C., “Atomic Force Microscope,” Physical Review Letters, 56, 9, 1986, 930-933.
3. [3] Coratger, R., Sivel, V., Ajustron, F. and Beauvillain, J., “Scanning Tunneling Microscopy and Related Techniques for Surface Analysis,” Micron, 25, 4, 1994, 371-385.
4. [4] Meyer, G. and Amer, N. M., “Optical-Beam- Deflection Atomic Force Microscopy: The NaCl (001) Surface,” Applied Physics Letters, 56, 21, 1990, 2100-2101.
5. [5] den Boef, A. J., “Scanning Force Microscopy Using a Simple Low-Noise Interferometer,” Applied Physics Letters, 55, 5, 1989, 439-441.
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