On the Measurement of Electron Impact lonisation Cross-sections for Highly Charged Ions Using an Electron Beam Ion Trap (EBIT)-Reference-Cited by-同舟云学术

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On the Measurement of Electron Impact lonisation Cross-sections for Highly Charged Ions Using an Electron Beam Ion Trap (EBIT)

Published:1999 Issue:B Volume:T80 Page:289
ISSN:0031-8949
Container-title:Physica Scripta
language:en
Short-container-title:Physica Scripta

Author:

Sokell E.,Currell F. J.,Shimizu H.,Ohtani S.

Publisher

IOP Publishing

Subject

Condensed Matter Physics,Mathematical Physics,Atomic and Molecular Physics, and Optics

Link

http://stacks.iop.org/1402-4896/1999/i=T80B/a=049/pdf

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characteristics of ground state electronic structures of ionized atoms and rules of their orbital competitions;Acta Physica Sinica;2016

2. Growth of Ionization Balance from F-like to Bare Ions of Heavy Atoms in an Electron Beam Ion Trap;Plasma and Fusion Research;2008

3. Electron Impact Ionisation of Hydrogen-Like Ions;The Physics of Multiply and Highly Charged Ions;2003

4. Thomson scattering system at the Tokyo electron beam ion trap;Review of Scientific Instruments;2002-01

5. Beam Diagnostics by Thomson Scattering with the Tokyo-EBIT;Physica Scripta;2001

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