Argon ion slicing (ArIS): a new tool to prepare super large TEM thin films from Earth and planetary materials-Reference-Cited by-同舟云学术

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Argon ion slicing (ArIS): a new tool to prepare super large TEM thin films from Earth and planetary materials

Published:2010-03-18 Issue:1 Volume:22 Page:17-21
ISSN:0935-1221
Container-title:European Journal of Mineralogy
language:en
Short-container-title:ejm

Author:

Stojic Aleksandra N.,Brenker Frank E.

Publisher

Schweizerbart

Subject

Geochemistry and Petrology

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Principal Studies of the First Solid Material Formed in the Early Solar System: A Review;Geochemistry International;2023-08

2. Principal Studies of the First Solid Material Formed in the Early Solar System: A Review;Геохимия;2023-08-01

3. Study of the contact angle of water droplet on the surface of natural K-feldspar with the combination of Ar+ polishing and atomic force microscopy scanning;Chemical Engineering Science;2021-09

4. Grain Size Sensitive Creep During Simulated Seismic Slip in Nanogranular Fault Gouges: Constraints From Transmission Kikuchi Diffraction (TKD);Journal of Geophysical Research: Solid Earth;2019-10

5. Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy;Geoscientific Instrumentation, Methods and Data Systems;2019-03-14

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