Measurement of the thermal transport properties of dielectric thin films using the micro-Raman method
Author:
Publisher
Zhejiang University Press
Subject
General Engineering
Link
http://link.springer.com/content/pdf/10.1631/jzus.A0820493.pdf
Reference28 articles.
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3. Burzo, M.G., Komarov, P.L., Raad, P.E., 2002. Influence of the metallic absorption layer on the quality of thermal conductivity measurements by the transient thermo-reflectance method. Microelectronics Journal, 33(9):697–703. [doi:10.1016/S0026-2692(02)00052-6]
4. Burzo, M.G., Komarov, P.L., Raad, P.E., 2003. Thermal transport properties of gold-covered thin-film silicon dioxide. IEEE Transactions on Components and Packaging Technologies, 26(1):80–88. [doi:10.1109/TCAPT.2003.811467]
5. Cahill, D.G., 1998. Heat transport in dielectric thin films and at solid-solid interfaces, In: Tien, C.L., Majumdar, A., Gerner, F. (Eds.), Microscale Energy Transport. Taylor & Francis, p.108–109.
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