Mean shift texture surface detection based on WT and COM feature image selection
Author:
Publisher
Zhejiang University Press
Subject
General Engineering
Link
http://link.springer.com/content/pdf/10.1631/jzus.2006.A0969.pdf
Reference18 articles.
1. Abrantes, A.J., Marques, J.S., 2004. The Mean Shift Algorithm and the Unified Framework. Proceedings of the 17th International Conference on Pattern Recognition (ICPR’04), 1:244–247.
2. Ahmadian, A., Mostafa, A., 2003. An Efficient Texture Classification Algorithm Using GABOR Wavelet. Proceedings of the 25th Annual International Conference of the IEEE EMBS. Cancun, Mexico, (17–21):930–933.
3. Arivazhagan, S., Ganesan, L., 2003. Texture segmentation using wavelet transform. Pattern Recognition Letters, 24(16):3197–3203. [doi:10.1016/j.patrec.2003.08.005]
4. Chan, C.H., Pang, K.H., 2000. Fabric defect detection by Fourier analysis. IEEE Trans. on Industry Applications, 36(5):1267–1276. [doi:10.1109/28.871274]
5. Cheng, Y.Z., 1995. Mean shift, mode seeking, and clustering. IEEE Trans. on Pattern Analysis and Machine Intelligence, 17(8):790–799. [doi:10.1109/34.400568]
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