Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
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Published:2023-06-30
Issue:196
Volume:
Page:
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ISSN:1940-087X
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Container-title:Journal of Visualized Experiments
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language:en
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Short-container-title:JoVE
Author:
Pérez Ladrón de Guevara Héctor,Villa-Cruz Virginia,Patakfalvi Rita,Zelaya-Molina Lily Xochilt,Muñiz-Diaz Ramiro
Publisher
MyJove Corporation
Subject
General Immunology and Microbiology,General Biochemistry, Genetics and Molecular Biology,General Chemical Engineering,General Neuroscience
Cited by
1 articles.
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