Cold field emission electrode as a local probe of proximal microscopes: Investigation of defects in monocrystalline silicon solar cells

Author:

Tománek P.,Škarvada P.,Dallaeva D.,Grmela L.,Macků R.,Smith S.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,Geotechnical Engineering and Engineering Geology,Civil and Structural Engineering

Reference14 articles.

1. EBIC and luminescence studies of defects in solar cells;O. Breitenstein;Scanning,2008

2. Mapping local photocurrents in polymer/fullerene solar cells with photo-conductive atomic force microscopy;D. Coffey;Nano Lett.,2007

3. Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells;Grmela Lubomír;Sol. Energ. Mat. Sol. C.,2012

4. Fast series resistance imaging for silicon solar cells using electroluminescenFast series resistance imaging for silicon solar cells using electroluminescence;J. Haunschild;Phys. Status Solidi RRL,2009

5. Progress in silicon solar cell characterization with infrared imaging methods;M. Kasemann,2008

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