Fault-tolerance in VLSI systems design using data compression under constraints of failure probabilities-overview and current status-Reference-Cited by-同舟云学术

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Fault-tolerance in VLSI systems design using data compression under constraints of failure probabilities-overview and current status

Published:2013-03 Issue:1 Volume:10 Page:73-84
ISSN:1708-5284
Container-title:World Journal of Engineering
language:en
Short-container-title:World Journal of Engineering

Author:

Das Sunil,Biswas Satyendra,Petriu Emil,Groza Voicu,Assaf Mansour,Nayak Amiya

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,Geotechnical Engineering and Engineering Geology,Civil and Structural Engineering

Reference24 articles.

1. Design of cache test hardware on the HP PA8500;J. Brauch;IEEE Des. Test Comput,1998

2. Finding all cliques of an undirected graph;C. Bron;Commun. ACM,1973

3. Pentium pro processor design for test and debug;A. Carbine;IEEE Des. Test Comput,1998

4. Built-in self-test trends in Motorola microprocessor;R. Daniels;IEEE Des. Test Comput,1985

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