Fast Generation of Random Spanning Trees and the Effective Resistance Metric-Reference-Cited by-同舟云学术

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Fast Generation of Random Spanning Trees and the Effective Resistance Metric

Published:2014-12-22 Issue: Volume: Page:
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Container-title:Proceedings of the Twenty-Sixth Annual ACM-SIAM Symposium on Discrete Algorithms
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Author:

Madry Aleksander,Straszak Damian,Tarnawski Jakub

Publisher

Society for Industrial and Applied Mathematics

Link

https://epubs.siam.org/doi/pdf/10.1137/1.9781611973730.134

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Singular Value Approximation and Sparsifying Random Walks on Directed Graphs;2023 IEEE 64th Annual Symposium on Foundations of Computer Science (FOCS);2023-11-06

3. Efficient Resistance Distance Computation: The Power of Landmark-based Approaches;Proceedings of the ACM on Management of Data;2023-05-26

4. Models of random subtrees of a graph;Probability Surveys;2023-01-01

5. Network Design for s - t Effective Resistance;ACM Transactions on Algorithms;2022-07-31

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