Lattice-Based Patterned Fabric Inspection by Using Total Variation with Sparsity and Low-Rank Representations-Reference-Cited by-同舟云学术

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Lattice-Based Patterned Fabric Inspection by Using Total Variation with Sparsity and Low-Rank Representations

Published:2017-01 Issue:4 Volume:10 Page:2140-2164
ISSN:1936-4954
Container-title:SIAM Journal on Imaging Sciences
language:en
Short-container-title:SIAM J. Imaging Sci.

Author:

Ng Michael K.,Ngan Henry Y. T.,Yuan Xiaoming,Zhang Wenxing

Funder

Hong Kong Research Grants Council

Key Laboratory of Remote Measuring and Control, Jiangsu Province

National Natural Science Foundation of China

Publisher

Society for Industrial & Applied Mathematics (SIAM)

Subject

Applied Mathematics,General Mathematics

Link

https://epubs.siam.org/doi/pdf/10.1137/17M1113138

Reference40 articles.

1. An Augmented Lagrangian Approach to the Constrained Optimization Formulation of Imaging Inverse Problems

2. Fabric defect detection based on multiple fractal features and support vector data description

3. On the convergence of the direct extension of ADMM for three-block separable convex minimization models with one strongly convex function

4. Near-Optimal Signal Recovery From Random Projections: Universal Encoding Strategies?

5. Fabric defect inspection using prior knowledge guided least squares regression

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