Author:
Matulef Kevin,O'Donnell Ryan,Rubinfeld Ronitt,Servedio Rocco A.
Publisher
Society for Industrial & Applied Mathematics (SIAM)
Subject
General Mathematics,General Computer Science
Cited by
31 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An optimal tester for k-linear;Theoretical Computer Science;2023-03
2. Local concentration inequalities and Tomaszewski’s conjecture;Proceedings of the 53rd Annual ACM SIGACT Symposium on Theory of Computing;2021-06-15
3. VC dimension and distribution-free sample-based testing;Proceedings of the 53rd Annual ACM SIGACT Symposium on Theory of Computing;2021-06-15
4. Robust testing of low dimensional functions;Proceedings of the 53rd Annual ACM SIGACT Symposium on Theory of Computing;2021-06-15
5. Robust Neural Computation From Error Correcting Codes : An Invited Paper;2020 IEEE Information Theory Workshop (ITW);2021-04-11