Funder
Deutsche Forschungsgemeinschaft
Publisher
Society for Industrial & Applied Mathematics (SIAM)
Cited by
2 articles.
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1. Symmetries in Transmission Electron Microscopy images of semiconductor nanostructures with strain;2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD);2023-09-18
2. Symmetries in transmission electron microscopy imaging of crystals with strain;Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences;2022-11