Analysis of a Trace Class Stekloff Eigenvalue Problem Arising in Inverse Scattering
Author:
Funder
National Defense Science and Engineering Graduate
Publisher
Society for Industrial & Applied Mathematics (SIAM)
Subject
Applied Mathematics
Link
https://epubs.siam.org/doi/pdf/10.1137/19M1295155
Reference11 articles.
1. Spectral Characterization of the Trace Spaces ${H^s({\partial \Omega})}$
2. New sets of eigenvalues in inverse scattering for inhomogeneous media and their determination from scattering data
3. Transmission eigenvalues with artificial background for explicit material index identification
4. Inside–outside duality with artificial backgrounds
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