Imaging with Thermal Noise Induced Currents-Reference-Cited by-同舟云学术

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Imaging with Thermal Noise Induced Currents

Published:2024-05-21 Issue:2 Volume:17 Page:984-1006
ISSN:1936-4954
Container-title:SIAM Journal on Imaging Sciences
language:en
Short-container-title:SIAM J. Imaging Sci.

Author:

DeGiovanni Trent¹,Vasquez Fernando Guevara²^ORCID,Mauck China³

Affiliation:

1. Mathematics Department, University of Utah, Salt Lake City, UT 84112-0090 USA. Current address: Department of Mathematics, Dartmouth University, Hanover, NH 03755 USA.

2. Mathematics Department, University of Utah, Salt Lake City, UT 84112-0090 USA.

3. Mathematics Department, University of Utah, Salt Lake City, UT 84112-0090 USA. Current address: STV Incorporated, Chicago, IL 60606 USA.

Funder

National Science Foundation

Publisher

Society for Industrial & Applied Mathematics (SIAM)

Reference39 articles.

1. Math. Appl. (Berlin) 62;Ammari H.,2008

2. Electrical Impedance Tomography by Elastic Deformation

3. Microwave Imaging by Elastic Deformation

4. Cauchy problem for ultrasound-modulated EIT

5. Math. Sci. Res. Inst. Publ. 60;Bal G.,2013

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