Publisher
Society for Industrial & Applied Mathematics (SIAM)
Cited by
36 articles.
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1. The Effects of Process Variations and BTI in Packaged FinFET Devices;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
2. Basic Reliability Tools for SHM Protocols;Reliability and Physics‐of‐Healthy in Mechatronics;2022-12-09
3. Introduction to Part 1;Reliability and Physics‐of‐Healthy in Mechatronics;2022-12-09
4. Acceptance Sampling Based on Life Tests from Some Specific Distributions;Testing and Inspection Using Acceptance Sampling Plans;2019
5. A comparative study of reliability for finfet;Facta universitatis - series: Electronics and Energetics;2018