Emission Properties from Induced Structural Degradation of a-C:H Thin Film-Reference-Cited by-同舟云学术

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Emission Properties from Induced Structural Degradation of a-C:H Thin Film

Published:2011-06-25 Issue:3 Volume:12 Page:89-92
ISSN:1229-7607
Container-title:Transactions on Electrical and Electronic Materials
language:en
Short-container-title:Transactions on Electrical and Electronic Materials

Author:

Yoo Young-Zo,Song Jeong-Hwan

Publisher

The Korean Institute of Electrical and Electronic Material Engineers

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://ocean.kisti.re.kr/downfile/crosscheck/kieeme/JAKO201120956421762.pdf

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Complete characterization by Raman spectroscopy of the structural properties of thin hydrogenated diamond-like carbon films exposed to rapid thermal annealing;Journal of Applied Physics;2014-09-28

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