Abstract
Thin films of cadmium selenide with a thickness h = 200-500 nm were obtained and their surface properties were studied. The studies were carried out using a Scanning Electron Microscope. It was found that with increasing thickness of thin layers, the surface structure becomes smoother. A compositional analysis of the surface of thin layers was also carried out. Elemental analysis was carried out in layers of various thicknesses, the percentage content of chemical elements and the energy spectrum of chemical elements were determined. It has been established that thin CdSe films obtained by chemical deposition are quite pure. The surface of thin layers with a thickness h > 400 nm turned out to be quite smooth, which is an indicator of the formation of a phase in these layers corresponding to the CdSe compound.
Publisher
V. N. Karazin Kharkiv National University
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