Author:
Yawen Liu,Qinmin Fan,Daolun Li
Abstract
AbstractA method for the direct determination of trace elements in light element matrices is described. The intensity of Compton scatter of the incident X-rays from the specimen was used to evaluate the apparent absorption factor for the direct correction for matrix effects. This permits the use of single element standards for samples of varied and complicated matrix composition. Relative errors of approximately 5% were obtained for results in the concentration range of 10-200 ppm.
Publisher
Cambridge University Press (CUP)
Cited by
1 articles.
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