An Introduction to Total Reflection X-Ray Microscopy*

Abstract

AbstractThe reflection X-ray microscope is a microscope in the conventional sense. X-rays are actually focused in the formation of magnified images of minute objects. Its principal component is a pair of concave glass mirrors whichhave been polished and figured with great care. In common with other optical devices, the reflection X-ray microscope suffers from various aberrations which limit its resolution. Until recently its narrow field and lack of contrast have made it impractical for the examination of histological or metallurgical specimens.The X-ray microscope has the theoretical advantage of resolution when compared with the optical microscope. While it cannot compete with the ultimate resolution of the electron microscope, it has the advantage of being able to reveal the internal details of objects which are opaque to the electron microscope- Although there is no doubt that the X-ray microscope can contribute to our knowledge of structural details, perhaps its greatest potential lies in its analytical-chemistry aspects. Already a technique exists at unit magnification (contact microradiography) for weighing histological specimens whose cellular structures range from 10−12 to 10−14 g. The enlarged image provided by X-ray microscopy should greatly aid in a more extensive application of the technique.The above advantages and possible areas of application are a source of continuous stimulation in the development of a reflection X-ray microscope which will operate close to its theoretical limit of resolution.