Author:
Morton R. W.,Witherspoon K. C.
Abstract
AbstractThis paper describes the imaging of fossils using elemental x-ray area mapping (EXAM). The technique utilizes a commercially available instrument originally designed for the silicon chip industry. The EXAM data are processed digitally with imaging software to remove surface irregularities and enhance specimen details. Applications of this technique to specimens with irregular surfaces are described.
Publisher
Cambridge University Press (CUP)