Fast Thickness Measurement of Thin Crystalline Layers by Relative Intensities in XRPD Method

Abstract

In this work a continuous wave CO2 laser was used for melting a layer of amorphous alumina obtained by anodizing 6061 aluminum plates. Melting the surface of the anodized plates led to the formation of a new uniform corundum layer at the expense of some of the amorphous coating, resulting in a double layer coating of crysta11ine on amorphous.The characterization of the corundum layer is essential for process optimization study. Among the non-destructive methods X-ray diffraction is useful, because it provides us with selected data on the crystalline layer.