A Simple Multielement-Calibration System for Analysis of Minor and Major Elements in Minerals by Fluorescent X-Ray Spectrography

Abstract

AbstractTechniques of mineral analysis by fluorescent X-ray spectrography can generally be classified on the basis of (1) extensive sample preparation and simple instrumental examination, (2) simple sample preparation and extensive instrumental examination, (3) extensive processes for both, or (4) simple processes for both major phases of the technique. The latter type of technique is usually the most commensurate with the concept “maximum information with minimum effort.”Suitable analytical results with multielement calibration systems for random mineral samples can be obtained if there are valid considerations of the relevant absorption and enhancement effects or if the systems are based on general procedures to minimize absorption and enhancement effects. Preliminary investigation indicated that control of sample mass and use of thin films of the mineral sample is a convenient and simple method of minimizing absorption and enhancement effects.Successful application of thin-film samples with known masses in a multielement calibration system is highly dependent upon details of sample preparation and comprehensive studies of these details will be discussed.The calibration system is suitable for the determination of minor and major concentrations in the sample, but it is not recommended for determination of trace concentrations.