Abstract
AbstractA highly simplified multielement calibration systemfor semiquantitativeanalyses of mineral samples by fluorescent X-ray spectrography was discussed at the Eighth Annual Conference on Applications of X-ray Analysis. This system relates scattered radiation intensity (background) with peak intensity as measuredon a chart recording to determine concentrations of several elements in a sample.A continuation of the study reveals the effects of operating variables such as: (1) sample preparation and choice of sample type, (2) operating power and target choice of the X-ray tube, (3) collimation ratio, (4) goniometer scanning rate, (5) choice of method for measurement of background intensity, and (6) control and adjustment of detector, sealer-ratemeter, recorder, and other electronic circuits.The over-all effects of some operating variables are negligible owing to the compensatory nature of the calibration system. The net effects of others can be directly attributed to particular operating conditions, and these conditions can be controlled to achieve an optimum balance of effects to yield the desired results for accuracy, time required to complete the analyses, and other important requirements in the analyses of minerals.
Publisher
Cambridge University Press (CUP)
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