Abstract
AbstractArt X-ray diffraction study has been conducted on the emissive coating (Ba, Sr, CaO) of experimental diodes from which thermionic emission data were taken before X-ray analysis. The tubes were then opened and the oxide protected by special techniques in order to prevent the formation of the hydroxide. In addition to X-ray diffraction, other techniques were used to give a complete description of the structures present.
Publisher
Cambridge University Press (CUP)
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