Abstract
AbstractTwo-dimensional geometry information contained in SAED spot patterns augmented with EDS elemental data is employed in a computerized phase identification of microcrystalline particles. The initial chemistry screening of a laboratory managed database using the 'bitmap' concept is followed by a geometry search/match treating of the spot patterns as planar sections through the reciprocal lattice of a candidate phase. The identification is selective, fast, and yields to a complete automatization,
Publisher
Cambridge University Press (CUP)
Cited by
3 articles.
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