Abstract
The effect of the position of the X-ray unresolved Kα1 - Kα2 line doublets, diffracted from powder specimens, on the precision of the calculated lattice constant has been determined using a least-squares analysis. An analytical procedure to synthesize CuKα doublet X-ray diffraction peaks with X-ray characteristic lines (half widths ranging from 0.1° to 0.4° 26) has been applied in correcting the weighted wavelength of the doublet peak position. A series of correction curves was established from which the true 26 peak position of the weighted Kα wavelength could be determined from the measured 29 peak position.
Publisher
Cambridge University Press (CUP)
Reference4 articles.
1. “The Effect of Systematic Errors on the Measurement of Lattice Constants,”;Gazzara;Army Materials and Mechanics Research Center,1970
2. “Determination of Lattice Parameters with the Aid of a Computer,”;Mueller;ActaCryst,1960
3. “Peak Height Approximation for X-Ray Diffracted Integrated Intensity,”;Gazzara;Advances in X-Ray Analysis,1976
4. Precision X-Ray Diffractometry Using Powder Specimens