Author:
Kanngieβer Birgit,Qeckhoff Burkbard,Scheer Jens,Swoboda Walter,Laursen Jens
Abstract
A toroidal focLising W/Si multilayer and a planar W/Si multilayer were tested for the possible usefulness for the Energy Dispersive X-Ray Fluorescence Analysis (EDXXRF) of low Z elements.
Publisher
Cambridge University Press (CUP)