Author:
De la Torre Ángeles G.,López-Olmo María-Gema,Álvarez-Rua Carmen,García-Granda Santiago,Aranda Miguel. A. G.
Abstract
Single crystals of gypsum were studied in a diffractometer equipped with a CCD two-dimensional detector. The microstructure of the crystal gave wide poorly shaped spots showing sometimes curved streaks around the spots, which made the integration process very difficult, yielding a low quality structure. The crystal structure and microstructure of gypsum has been studied by high-resolution synchrotron powder diffraction of a ground single crystal. The intensities in the synchrotron powder pattern can be reliably fitted although the peak shape displays anisotropic peak broadening. The Rietveld results for gypsum were a=6.522 91(3) Å, b=15.197 63(9) Å, c=6.522 91(3) Å, β=118.479(1)°, V=494.536(5) Å3and Z=4 (s.g. I2/c) with RWP=5.39% and RF=1.64%. We have also studied the influence of the structural description used for gypsum in a synchrotron Rietveld quantitative phase analysis of a standard mixture containing 50 wt % of CaSO4⋅2H2O and Al2O3. Finally, the effects of the type of preferred orientation correction for laboratory X-ray powder data are also discussed. ©2004 International Centre for Diffraction Data.
Publisher
Cambridge University Press (CUP)
Subject
Condensed Matter Physics,Instrumentation,General Materials Science,Radiation
Cited by
49 articles.
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