The Choice of Lattice Planes in X-Ray Strain Measurements of Single Crystals

Abstract

It is well known that all of the six independent components of the strain tensor can be calculated if the linear strains in six appropriate directions are known (e.g.). That calculation is to solve a system of linear equations, whose coefficients are defined by the orientations of the measured planes. The strains are determined by lattice plane distance measurements using X-rays.The linear equation system can only be solved if the matrix of coefficients has rank. Whether this condition is met or not can be decided without calculating a determinant just from geometric relationships among the planes to be measured. A demand beyond that necessary condition is to make the matrix of coefficients so that the accuracy of the calculated strain tensor is best. From error calculation we know that there exist distinct ratios between the inevitable measurement errors and the errors of the calculated strain components. These ratios depend strongly on the geometric relationship among the lattice planes. It is the purpose of this paper to show how lattice planes should be chosen in order to get these ratios as small as possible i.e. to get a maximum of accuracy at a given number of measurements, or a minimum of experimental effort if a distinct limit of error is to be reached.