Author:
Huang T. C.,Parrish W.,Ayers G. L.
Abstract
AbstractThis paper describes a computer method for wavelength dispersive (WD) qualitative X-ray fluorescence (XRF) analysis. It determines the elements, spectral lines, wavelengths, reflection angles and peak intensities of the first and second order reflections in less than half a minute of time using an IBM Series/1 minicomputer. The resolution and precision are significantly better than the energy dispersive (ED) method and when combined with high speed computer recording the speed is comparable.
Publisher
Cambridge University Press (CUP)
Cited by
1 articles.
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