Author:
Hauk Viktor M.,Macherauch Eckard
Abstract
AbstractThis paper summarizes experiences available for the measurement of lattice strains in different materials with different wavelengths to evaluate stresses by means of X-rays. The recommendations given are based on previous statements. Some principles of fundamentals of X-ray physics for the recording of interference lines with Ω and ψ-diffractometers are dealt with. Methods applicable for the determination of the peak position of the interference lines, the assessment of linear and non-linear lattice strain distributions, and tine calculation of stresses are outlined. For iron, aluminium, copper, nickel and titanium the constants for practical X-ray stress evaluation (XSE) and the parameters of measurement are tabled.
Publisher
Cambridge University Press (CUP)
Cited by
11 articles.
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