Some Notes on Ultrasoft X-Ray Fluorescence Analysis—10 to 100 Å Region*

Author:

Henke Burton L.

Abstract

AbstractMethods and instrumentation have heen developed for the extension of X-ray fluorescence analysis into the light element region, magnesium through beryllium. Examples of current values for the minimum detectable limits for these elements and associated instrumental parameters are presented. Some specific techniques are described for the use of an ultrasoft X-ray vacuum spectrograph, for the development of large d-spacing multilayer analyzers, and for the construction of thin window systems.

Publisher

Cambridge University Press (CUP)

Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Properties of curved x‐ray diffractors with stepped surfaces;Journal of Applied Physics;1991-04

2. Nanotechnology;Journal of Physics E: Scientific Instruments;1987-12

3. The use of Layered Synthetic Microstructures for Quantitative Analysis of Elements: Boron to Magnesium;Advances in X-Ray Analysis;1987

4. Submicron entrance windows for an ultrasoft x‐ray camera;Review of Scientific Instruments;1981-05

5. A double-focusing soft X-ray spectrometer with independent adjustment of Bragg and observation angles;Journal of Physics E: Scientific Instruments;1976-08

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