Thin film characterization using terahertz differential time-domain spectroscopy and double modulation-Reference-Cited by-同舟云学术

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Thin film characterization using terahertz differential time-domain spectroscopy and double modulation

Published:2001-11-21 Issue: Volume: Page:
ISSN:0277-786X
Container-title:Electronics and Structures for MEMS II
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Author:

Mickan Samuel P.,Lee Kwang-Su,Lu Toh-Ming,Barnat Edward,Munch Jesper,Abbott Derek,Zhang Xi-Cheng

Publisher

SPIE

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Zener Tunneling Breakdown in Phase-Change Materials Revealed by Intense Terahertz Pulses;Physical Review Letters;2018-10-19

3. An impact of multiple wave reflections in a flat sample on material parameter reconstruction using THz pulsed spectroscopy;Journal of Physics: Conference Series;2015-01-30

4. Antiferromagnetic resonance excitation by terahertz magnetic field resonantly enhanced with split ring resonator;Applied Physics Letters;2014-07-14

5. Accuracy of sample material parameters reconstruction using terahertz pulsed spectroscopy;Journal of Applied Physics;2014-05-21

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