Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent Developments-Reference-Cited by-同舟云学术

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Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent Developments

Published:1988-07-12 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Pohl D. W.¹,Fischer U. C.²,Durig U. T.¹

Affiliation:

1. IBM Research Division (Switzerland)

2. Ernst-Leitz-Wetzlar (Germany)

Publisher

SPIE

Cited by 36 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Patterning of Conjugated Polymers for Organic Optoelectronic Devices;Small;2011-04-26

2. Evanescent-field scanning microscope with fourier-transform infrared spectrometer;Scanning;2008-04-16

3. Scanning probe microscopy at video-rate;Materials Today;2008

4. Apertureless Near-Field Probes;Nano-Optics;2002

5. Recent developments of probes for scanning probe microscopy;Advances in Imaging and Electron Physics;2001

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