Semiconductor-metal interface influence on the bulk low-frequency noise behavior and role of the phonons refraction points-Reference-Cited by-同舟云学术

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Semiconductor-metal interface influence on the bulk low-frequency noise behavior and role of the phonons refraction points

Published:2005-05-23 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Asriyan H. V.,Shatveryan A. A.,Aroutiounian V. M.,Gasparyan F. V.,Melkonyan S. V.,Mkhitharian Z. H.,Ayvazyan G.

Publisher

SPIE

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