Development of a compact inner profile measuring instrument-Reference-Cited by-同舟云学术

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Development of a compact inner profile measuring instrument

Published:2007-09-26 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Wakayama T.,Takano H.,Yoshizawa T.

Publisher

SPIE

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Review of optical detection technologies for inner-wall surface defects;Optics & Laser Technology;2023-07

2. Multi-ring Beam Sensing System for Three-dimensional Measurement of the Narrow Inner Surface Profiles;2022 Asia Communications and Photonics Conference (ACP);2022-11-05

3. Review of optical measurement techniques for measuring three-dimensional topography of inner-wall-shaped parts;Measurement;2022-10

4. Curved light surface model for calibration of a structured light 3D modeling system based on striped patterns;Optics Express;2020-10-20

5. Dimensional measurement of internal profile using the optical caliper;Optical Metrology and Inspection for Industrial Applications V;2018-11-02

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